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Secondary Resonance Magnetic Force Microscopy
- Source :
- The 6th International Conference on the Science and Technology for Advenced Ceramics(STAC-6).
- Publication Year :
- 2012
-
Abstract
- In this study, we have developed secondary resonance magnetic force microscopy (SR-MFM) for imaging alternating magnetic fields from a sample surface at the secondary resonant frequency of the magnetic cantilever at the same time as the topographic image. SR-MFM images of alternating magnetic fields diverging from the main pole in a driving perpendicular magnetic recording head are presented, and the divergence and convergence of the fields are discussed. The spatial resolution of SR-MFM is estimated to be 18 nm; this is 2.5 times smaller than that of conventional MFM.
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- The 6th International Conference on the Science and Technology for Advenced Ceramics(STAC-6)
- Accession number :
- edsair.doi.dedup.....8ac2f7af6e5e95c47b847ee952a8543d