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Simple and cost-effective thickness measurement terahertz system based on a compact 155 μm λ/4 phase-shifted dual-mode laser

Authors :
Kyung Hyun Park
Hyunsung Ko
Han-Cheol Ryu
Sang-Pil Han
Jeong-Woo Park
Namje Kim
Kiwon Moon
Source :
OPTICS EXPRESS(20): 23
Publication Year :
2012
Publisher :
The Optical Society, 2012.

Abstract

A simple thickness measurement method based on the coherent homodyne CW THz system was demonstrated; it does not require precise control of the frequencies of the beat source, and only accurate scanning of the optical delay line is needed. Three beat frequencies are sufficient for measuring the thickness of a sample without considering the modulo 2 pi ambiguity. A novel compact 1.55 mu m lambda/4 phase-shifted dual-mode laser (DML) was developed as an optical beat source for the CW THz system. The thickness of a sample was accurately estimated from the measurements using the proposed method. Our results clearly show the possibility of a compact, simple, and cost-effective CW THz system for practical applications. (C) 2012 Optical Society of America

Details

ISSN :
10944087
Volume :
20
Database :
OpenAIRE
Journal :
Optics Express
Accession number :
edsair.doi.dedup.....8a9b6356af86eb1365d954f07ae50082