Back to Search
Start Over
Nomarski imaging interferometry to measure the displacement field of MEMS
- Source :
- Applied optics, Applied optics, 2006, 45(30), pp.7800, Applied optics, Optical Society of America, 2006, 45(30), pp.7800
- Publication Year :
- 2006
- Publisher :
- HAL CCSD, 2006.
-
Abstract
- We propose to use a Nomarski imaging interferometer to measure the out-of-plane displacement field of MEMS. It is shown that the measured optical phase arises both from height and slope gradients. Using four integrating buckets a more efficient approach to unwrap the measured phase is presented, thus making the method well suited for highly curved objects. Slope and height effects are then decoupled by expanding the displacement field on a functions basis, and the inverse transformation is applied to get a displacement field from a measure of the optical phase map change with a mechanical loading. A measurement reproducibility of about 10 pm is achieved, and typical results are shown on a microcantilever under thermal actuation, thereby proving the ability of such a set-up to provide a reliable full-field kinematic measurement without surface modification.
- Subjects :
- [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics]
Height measurements
Classical Physics (physics.class-ph)
FOS: Physical sciences
Physics - Classical Physics
[SPI.MECA.MSMECA]Engineering Sciences [physics]/Mechanics [physics.med-ph]/Materials and structures in mechanics [physics.class-ph]
[PHYS.MECA.MSMECA]Physics [physics]/Mechanics [physics]/Materials and structures in mechanics [physics.class-ph]
[SPI.MECA.SOLID]Engineering Sciences [physics]/Mechanics [physics.med-ph]/Solid mechanics [physics.class-ph]
Interference microscopy
MEMS
Interferometry
Phase modulation
[PHYS.MECA.SOLID]Physics [physics]/Mechanics [physics]/Solid mechanics [physics.class-ph]
OCIS: 100.5070 120.3180 120.2830 120.5060 180.3170
[PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det]
[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
Physics - Optics
Optics (physics.optics)
Phase retrieval
Subjects
Details
- Language :
- English
- ISSN :
- 1559128X, 21553165, 00036935, and 15394522
- Database :
- OpenAIRE
- Journal :
- Applied optics, Applied optics, 2006, 45(30), pp.7800, Applied optics, Optical Society of America, 2006, 45(30), pp.7800
- Accession number :
- edsair.doi.dedup.....8a67fb5d6f7802ed9de50c49cfc43f1e