Distributing the Electron Dose to Minimise Electron Beam Damage in Scanning Transmission Electron Microscopy

Authors :: Andrew Stevens
Juhan Lee
Nigel D. Browning
Houari Amari
Daniel Nicholls
B. Mehdi Layla
Source :: Microscopy and Microanalysis
Publication Year :: 2020
Publisher :: Oxford University Press (OUP), 2020.

Subjects :: Materials science
business.industry
Scanning transmission electron microscopy
Cathode ray
Electron dose
Optoelectronics
business
Instrumentation

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