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Determining the vibrations between sensor and sample in SQUID microscopy
- Source :
- Applied Physics Letters. 109:232601
- Publication Year :
- 2016
- Publisher :
- AIP Publishing, 2016.
-
Abstract
- Vibrations can cause noise in scanning probe microscopies. Relative vibrations between the scanning sensor and the sample are important but can be more difficult to determine than absolute vibrations or vibrations relative to the laboratory. We measure the noise spectral density in a scanning SQUID microscope as a function of position near a localized source of magnetic field, and show that we can determine the spectra of all three components of the relative sensor-sample vibrations. This method is a powerful tool for diagnosing vibrational noise in scanning microscopies.<br />4 pages, 3 figures
- Subjects :
- Physics and Astronomy (miscellaneous)
Physics::Medical Physics
FOS: Physical sciences
02 engineering and technology
01 natural sciences
Noise (electronics)
Spectral line
law.invention
Optics
law
Mesoscale and Nanoscale Physics (cond-mat.mes-hall)
0103 physical sciences
Microscopy
Physics::Atomic and Molecular Clusters
Physics::Chemical Physics
010306 general physics
Computer Science::Databases
Scanning SQUID microscope
Physics
Condensed Matter - Mesoscale and Nanoscale Physics
business.industry
Noise spectral density
fungi
food and beverages
021001 nanoscience & nanotechnology
Magnetic field
Vibration
SQUID
0210 nano-technology
business
Subjects
Details
- ISSN :
- 10773118 and 00036951
- Volume :
- 109
- Database :
- OpenAIRE
- Journal :
- Applied Physics Letters
- Accession number :
- edsair.doi.dedup.....8814262325bc916bd08de5d07e763470