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Determining the vibrations between sensor and sample in SQUID microscopy

Authors :
Lisa Paulius
Aaron J. Rosenberg
John R. Kirtley
Rahim R. Ullah
Mark B. Ketchen
Johanna C. Palmstrom
Y.-K.-K. Jung
Connor M. Holland
Daniel Schiessl
Kathryn A. Moler
Gerald W. Gibson
Source :
Applied Physics Letters. 109:232601
Publication Year :
2016
Publisher :
AIP Publishing, 2016.

Abstract

Vibrations can cause noise in scanning probe microscopies. Relative vibrations between the scanning sensor and the sample are important but can be more difficult to determine than absolute vibrations or vibrations relative to the laboratory. We measure the noise spectral density in a scanning SQUID microscope as a function of position near a localized source of magnetic field, and show that we can determine the spectra of all three components of the relative sensor-sample vibrations. This method is a powerful tool for diagnosing vibrational noise in scanning microscopies.<br />4 pages, 3 figures

Details

ISSN :
10773118 and 00036951
Volume :
109
Database :
OpenAIRE
Journal :
Applied Physics Letters
Accession number :
edsair.doi.dedup.....8814262325bc916bd08de5d07e763470