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Tracking with heavily irradiated silicon detectors operated at cryogenic temperatures

Authors :
S. Saladino
Peter Chochula
I. Konorov
V.G. Palmieri
P. Bartalini
B.M. Barnett
G. Ruggiero
Kevin M. Smith
L. Casagrande
Sergio Pagano
I. Stavitski
C. Parkes
Jan Buytaert
W. H. Bell
A. Esposito
T. J. V. Bowcock
D. Steele
T. Ruf
Soumen Paul
P. Collins
K. Pretzl
L. Schmitt
P. Sonderegger
T. O. Niinikoski
R. Frei
K. Borer
V. Granata
F. Vitobello
Hans Dijkstra
O. Dormond
S. Janos
Carlos Lourenco
C. Da Via
Source :
IEEE Transactions on Nuclear Science. 46:228-231
Publication Year :
1999
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 1999.

Abstract

In this work we show that a heavily irradiated double-sided silicon microstrip detector recovers its performance when operated at cryogenic temperatures. A DELPHI microstrip detector, irradiated to a fluence of /spl sim/4/spl times/10/sup 14/ p/cm/sup 2/, no longer operational at room temperature, cannot be distinguished from a non-irradiated one when operated at T

Details

ISSN :
15581578 and 00189499
Volume :
46
Database :
OpenAIRE
Journal :
IEEE Transactions on Nuclear Science
Accession number :
edsair.doi.dedup.....87f521eb77d21aa829acce24976b0317