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Study on characterisation and influence of surfactants on adhesion and coating thickness of electroless Ni-P deposits
- Source :
- IndraStra Global.
- Publication Year :
- 2012
-
Abstract
- Electroless nickel-phosphorus (EN) deposits with and without addition of surfactants were made on mild steel substrates. Two surfactants namely sodium dodecylsulfate (SDS) and cetyltrimethyl ammonium bromide (CTAB) were used in the study. The EN coated samples were characterised using X-ray diffraction analysis and transmission electron microscopy. The XRD pattern of all the deposits indicated the presence of crystalline and amorphous phases coexisting in the as deposited condition. Profile refinement techniques have been used to separate the crystalline nickel (111) reflection from the amorphous profile. The crystallite size of nickel was found to vary from 200 nm in the as deposited condition to 80 nm with addition of surfactant. TEM study reveals a nano crystalline structure of the deposit in as plated condition and an amorphous structure with addition of surfactants. With addition of surfactants adhesion was good. The coating thickness varied from 12.7 ?m to 32.2 ?m with addition surfactants. Copyright � 2012 Inderscience Enterprises Ltd.
- Subjects :
- Coated sample
Ammonium bromide
Materials science
Thickness measurement
chemistry.chemical_element
Electroless
engineering.material
Surface active agents
Structure (composition)
chemistry.chemical_compound
Amorphous structures
Coating thickness
Pulmonary surfactant
Coating
Mild steel substrates
Carbon steel
Coatings
General Materials Science
Sodium dodecyl sulfate
Ammonium compounds
Characterisation
Metallurgy
Crystalline materials
Phosphorus
X ray diffraction analysis
Adhesion
Refinement techniques
Amorphous solid
Nickel
Chemical engineering
chemistry
Transmission electron microscopy
Amorphous phasis
engineering
Deposits
Crystallite
Electroless Ni-P
XRD patterns
Nano-crystalline structures
Cetyltrimethylammonium bromide
Bromine compounds
Subjects
Details
- Language :
- English
- ISSN :
- 23813652
- Database :
- OpenAIRE
- Journal :
- IndraStra Global
- Accession number :
- edsair.doi.dedup.....87dedaec459621ad7448de023a28774d
- Full Text :
- https://doi.org/10.1504/IJMMP.2012.045804