Back to Search
Start Over
Generalized Additive Model Demonstrates Fluoroquinolone Use/Resistance Relationships for Staphylococcus Aureus
- Source :
- European Journal of Epidemiology. 19:453-460
- Publication Year :
- 2003
- Publisher :
- Springer Science and Business Media LLC, 2003.
-
Abstract
- Mathematical models currently used to study the relationship between the prevalence of the resistance to an antibiotic and the amount of drug may not be adequate because they do not integrate temporal and area analyses simultaneously. Furthermore, the forms of such relationship are unknown. We applied the Generalized Additive Model (GAM) to study fluoroquinolone use and the incidence of fluoroquinolone-resistance in Staphylococcus aureus in our institution over a 3-year period. Overall institution and individual hospital unitrestricted analyses were performed. Relative risk (RR) observed for increasing fluoroquinolone use with a 4-month lag from the 25th percentile to the 75th percentile was 1.27 (95% CI: 1.13-1.42). In the surgery units, RR was 1.23 (95% CI: 1.01-1.50) for fluoroquinolone use with a 2-months lag. GAM enabled us to observe for the first time a significant temporal relationship between fluoroquinolone use and the incidence of fluoroquinolone-resistant nosocomial S. aureus isolates.
- Subjects :
- Staphylococcus aureus
medicine.medical_specialty
Percentile
Time Factors
Epidemiology
Drug resistance
medicine.disease_cause
Staphylococcal infections
Risk Assessment
Microbiology
Drug Utilization Review
Internal medicine
Drug Resistance, Bacterial
medicine
Humans
Antibacterial agent
Cross Infection
business.industry
Incidence
Incidence (epidemiology)
Generalized additive model
Length of Stay
Staphylococcal Infections
medicine.disease
Relative risk
Linear Models
France
business
Hospital Units
Fluoroquinolones
Subjects
Details
- ISSN :
- 03932990
- Volume :
- 19
- Database :
- OpenAIRE
- Journal :
- European Journal of Epidemiology
- Accession number :
- edsair.doi.dedup.....8702ce65ca366777fcd01013af1e0f20
- Full Text :
- https://doi.org/10.1023/b:ejep.0000027348.92979.94