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Dielectric response of various partially cured epoxy nanocomposites

Authors :
H. Couderc
I. Preda
Rinat Nigmatullin
Jerome Castellon
S. Thompson
Michel Frechette
Fengge Gao
A. F. Vaessen
Serge Agnel
Institut d’Electronique et des Systèmes (IES)
Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)
Groupe énergie et matériaux (GEM)
Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)
Institut de Recherche d'Hydro-Québec [Varennes] (IREQ)
Laboratoire d'Ingénierie des Matériaux de Bretagne (LIMATB)
Université de Bretagne Sud (UBS)-Université de Brest (UBO)-Institut Brestois du Numérique et des Mathématiques (IBNM)
Université de Brest (UBO)-Université de Brest (UBO)
School of Science and Technology [Nottingham, U.K.]
Nottingham Trent University
Source :
IEEE Transactions on Dielectrics and Electrical Insulation, IEEE Transactions on Dielectrics and Electrical Insulation, Institute of Electrical and Electronics Engineers, 2013, 20 (2), pp.580-591. ⟨10.1109/TDEI.2013.6508762⟩
Publication Year :
2013
Publisher :
HAL CCSD, 2013.

Abstract

Insufficient crosslinking and water uptake during fabrication or manipulation are known to affect the dielectric response of epoxies. Post thermal treatment may result in the completion of cross-linking, partial removal of water, and aging. In order to study the effect of manufacturing imprecision on dielectric response, several under-cured epoxybased nanocomposite samples with modified nanoclay fillers were investigated. In addition, the influence of silane coupling agents and the use of ultrasonic waves on the nanoclay intercalation were also studied. The structure of the samples and the extent of cross linking were characterized using X-ray Diffraction (XRD) and Differential Scanning Calorimetry (DSC) respectively. It was found that surface silanization lead to improved clay intercalation and higher extent of intercalation/exfoliation. The influence of post thermal treatment on the dielectric response of the materials was investigated using Broadband Dielectric Spectroscopy (BDS). Once the samples were in a stable dielectric state, relaxation maps were performed. It was found that the samples with silanized nanoclay have the lowest activation energy and they also proved to be the “strongest” vitreous materials.

Details

Language :
English
ISSN :
10709878
Database :
OpenAIRE
Journal :
IEEE Transactions on Dielectrics and Electrical Insulation, IEEE Transactions on Dielectrics and Electrical Insulation, Institute of Electrical and Electronics Engineers, 2013, 20 (2), pp.580-591. ⟨10.1109/TDEI.2013.6508762⟩
Accession number :
edsair.doi.dedup.....86d175112e4d81b3edef11d6a97a4a9b
Full Text :
https://doi.org/10.1109/TDEI.2013.6508762⟩