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Infrared spectroscopy of self-assembled monolayer films on silicon
- Source :
- Surface Science. 601:2566-2570
- Publication Year :
- 2007
- Publisher :
- Elsevier BV, 2007.
-
Abstract
- Infrared vibrational spectroscopy in an attenuated total reflection (ATR) geometry has been employed to investigate the presence of organic thin layers on Si-wafer surfaces. The phenomena have been simulated to show there can be a field enhancement with the presented single-reflection ATR (SR-ATR) approach which is substantially larger than for conventional ATR or specular reflection. In SR-ATR, a discontinuity of the field normal to the film contributes a field enhancement in the lower index thin film causing a two order of magnitude increase in sensitivity. SR-ATR was employed to characterize a single monolayer of undecylenic acid self-assembled on Si(1 1 1) and to investigate a two monolayer system obtained by adding a monolayer of bovine serum albumin protein.
- Subjects :
- Thin layers
Chemistry
Infrared
Analytical chemistry
Infrared spectroscopy
Self-assembled monolayer
Surfaces and Interfaces
Condensed Matter Physics
Surfaces, Coatings and Films
Attenuated total reflection
Monolayer
Materials Chemistry
Specular reflection
biological phenomena, cell phenomena, and immunity
Thin film
Subjects
Details
- ISSN :
- 00396028
- Volume :
- 601
- Database :
- OpenAIRE
- Journal :
- Surface Science
- Accession number :
- edsair.doi.dedup.....844cd55ed8be5c23a63d1477708fddad