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Exploiting the S-Iteration Process for Solving Power Flow Problems: Novel Algorithms and Comprehensive Analysis
- Source :
- Electronics; Volume 10; Issue 23; Pages: 3011, Electronics, Vol 10, Iss 3011, p 3011 (2021)
- Publication Year :
- 2021
- Publisher :
- Multidisciplinary Digital Publishing Institute, 2021.
-
Abstract
- In recent studies, the competitiveness of the Newton-S-Iteration-Process (Newton-SIP) techniques to efficiently solve the Power Flow (PF) problems in both well and ill-conditioned systems has been highlighted, concluding that these methods may be suitable for industrial applications. This paper aims to tackle some of the open topics brought for this kind of techniques. Different PF techniques are proposed based on the most recently developed Newton-SIP methods. In addition, convergence analysis and a comparative study of four different Newton-SIP methods PF techniques are presented. To check the features of considered PF techniques, several numerical experiments are carried out. Results show that the considered Newton-SIP techniques can achieve up to an eighth order of convergence and typically are more efficient and robust than the Newton–Raphson (NR) technique. Finally, it is shown that the overall performance of the considered PF techniques is strongly influenced by the values of parameters involved in the iterative procedure.
- Subjects :
- high order newton-like method
computational efficiency
TK7800-8360
Computer Networks and Communications
Computer science
Newton–Raphson
symbols.namesake
Power flow
Rate of convergence
Hardware and Architecture
Control and Systems Engineering
S-iteration process
Signal Processing
Convergence (routing)
power flow
symbols
Overall performance
Electronics
Electrical and Electronic Engineering
Newton's method
Algorithm
Iteration process
Subjects
Details
- Language :
- English
- ISSN :
- 20799292
- Database :
- OpenAIRE
- Journal :
- Electronics; Volume 10; Issue 23; Pages: 3011
- Accession number :
- edsair.doi.dedup.....8282e2b9be86bcb6393147a8fef65a06
- Full Text :
- https://doi.org/10.3390/electronics10233011