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Interferometric methods for static and dynamic characterizations of micromembranes for sensing functions

Authors :
Jacek Kacperski
Thierry Dean
Michal Jozwik
Christophe Gorecki
Hakan Urey
Adam Styk
Leszek Salbut
Alain Jacobelli
Institute of Atomic Physics
Université de Roumanie
Franche-Comté Électronique Mécanique, Thermique et Optique - Sciences et Technologies (UMR 6174) (FEMTO-ST)
Université de Technologie de Belfort-Montbeliard (UTBM)-Ecole Nationale Supérieure de Mécanique et des Microtechniques (ENSMM)-Université de Franche-Comté (UFC)
Université Bourgogne Franche-Comté [COMUE] (UBFC)-Université Bourgogne Franche-Comté [COMUE] (UBFC)-Centre National de la Recherche Scientifique (CNRS)
Ürey, Hakan
Salbut, Leszek
Kacperski, Jacek
Styk, Adam R.
Jozwik, Michal
Gorecki, Christophe
Jacobelli, Alain
Dean, Thierry
College of Engineering
Department of Electrical and Electronics Engineering
Source :
Proc. of SPIE, Photonics Europe 2004, Optical Micro-and Nanometrology in Manufacturing Technology, MEMS Characterization I, 29–30 april 2004, tome 5458, Proceedings of SPIE-The International Society for Optical Engineering
Publication Year :
2004
Publisher :
HAL CCSD, 2004.

Abstract

We present a methodology for static and dynamic testing of mechanical properties of microelements. The measurement path includes temporal phase shifting interferometry for quantitative static shape elements analysis. This is followed by determination of the resonance frequency by means of modified time average interferometry and transient amplitude and phase maps of vibrating micromembrane capturing and evaluation by phase shifting stroboscopic interferometry. Proper application of combination of these methods allows for quick and accurate analysis of micromembranes and optimization of their manufacturing conditions.<br />NA

Details

Language :
English
Database :
OpenAIRE
Journal :
Proc. of SPIE, Photonics Europe 2004, Optical Micro-and Nanometrology in Manufacturing Technology, MEMS Characterization I, 29–30 april 2004, tome 5458, Proceedings of SPIE-The International Society for Optical Engineering
Accession number :
edsair.doi.dedup.....7fcc87f99c385656dd71afdda2b93184