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Using infrared thermal responses for PCBA production tests: Feasibility study

Authors :
Nabil El Belghiti Alaoui
A. Boyer
Anais Cassou
Arnaud Viard
Patrick Tounsi
Équipe Énergie et Systèmes Embarqués (LAAS-ESE)
Laboratoire d'analyse et d'architecture des systèmes (LAAS)
Université Toulouse - Jean Jaurès (UT2J)-Université Toulouse 1 Capitole (UT1)
Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Université Toulouse III - Paul Sabatier (UT3)
Université Fédérale Toulouse Midi-Pyrénées-Institut National des Sciences Appliquées - Toulouse (INSA Toulouse)
Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Institut National Polytechnique (Toulouse) (Toulouse INP)
Université Fédérale Toulouse Midi-Pyrénées-Université Toulouse - Jean Jaurès (UT2J)-Université Toulouse 1 Capitole (UT1)
Université Fédérale Toulouse Midi-Pyrénées
ACTIA Automotive
Université Toulouse Capitole (UT Capitole)
Université de Toulouse (UT)-Université de Toulouse (UT)-Institut National des Sciences Appliquées - Toulouse (INSA Toulouse)
Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut National des Sciences Appliquées (INSA)-Université Toulouse - Jean Jaurès (UT2J)
Université de Toulouse (UT)-Université Toulouse III - Paul Sabatier (UT3)
Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP)
Université de Toulouse (UT)-Université Toulouse Capitole (UT Capitole)
Université de Toulouse (UT)
Source :
30 th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2019), 30 th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2019), Sep 2019, Toulouse, France
Publication Year :
2019
Publisher :
HAL CCSD, 2019.

Abstract

International audience; A Printed Circuit Board assembly (PCBA) testing approach using infrared thermal signatures is presented. The concept of thermal signature for PCBAs is introduced and proved by experience and simulation. Based on this concept, the testing method is able to detect assembly defects such as presence of the component, polarity, value and solder (shorts and opens) and in some cases component health state, it also can classify the components mounted on the PCB into two classes (fault-free, faulty). According to the thermal signature of each component on the PCBA, they can be also classified in the same classes. In this article focus is put on capacitor defects in a DC/DC converter, especially capacitor value defects. Therefore, they will be the main tested components. For a robust detection of multiple defect scenarios, the Principal Component Analysis (PCA) method is used as an outlier detection algorithm.

Details

Language :
English
Database :
OpenAIRE
Journal :
30 th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2019), 30 th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2019), Sep 2019, Toulouse, France
Accession number :
edsair.doi.dedup.....7ded87fc8ce58be9e4561270cf287c08