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High-resolution XES and RIXS studies with a von Hamos Bragg crystal spectrometer

Authors :
J. Hoszowska
J.-Cl. Dousse
Source :
Journal of Electron Spectroscopy and Related Phenomena. :687-690
Publication Year :
2004
Publisher :
Elsevier BV, 2004.

Abstract

The high-resolution von Hamos Bragg crystal spectrometer was constructed for the study of K X-ray emission from low- Z elements and L and M X-ray spectra of medium to high Z elements. Recently, this instrument was applied to high-resolution XES and RIXS studies using X-ray synchrotron radiation at the ID21 and BM5 beamlines at the ESRF. An outline of the spectrometer design and performance characteristics will be given. The studies deal with the energy dependent KL double photoexcitation of argon, the L 3 and M 1 atomic-level widths of elements 54≤ Z ≤77, and the evolution of the K-edge RIXS spectra of manganese oxides.

Details

ISSN :
03682048
Database :
OpenAIRE
Journal :
Journal of Electron Spectroscopy and Related Phenomena
Accession number :
edsair.doi.dedup.....7d0c4060a5bf23c8e177e9a7f85eb521
Full Text :
https://doi.org/10.1016/j.elspec.2004.02.005