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Direct Three-Dimensional Imaging of an X-ray Nanofocus Using a Single 60 nm Diameter Nanowire Device
- Source :
- Nano Letters
- Publication Year :
- 2020
- Publisher :
- American Chemical Society (ACS), 2020.
-
Abstract
- Nanoscale X-ray detectors could allow higher resolution in imaging and diffraction experiments than established systems but are difficult to design due to the long absorption length of X-rays. Here, we demonstrate X-ray detection in a single nanowire in which the nanowire axis is parallel to the optical axis. In this geometry, X-ray absorption can occur along the nanowire length, while the spatial resolution is limited by the diameter. We use the device to make a high-resolution 3D image of the 88 nm diameter X-ray nanofocus at the Nanomax beamline, MAX IV synchrotron, by scanning the single pixel device in different planes along the optical axis. The images reveal fine details of the beam that are unattainable with established detectors and show good agreement with ptychography.
- Subjects :
- Diffraction
Letter
Materials science
Astrophysics::High Energy Astrophysical Phenomena
Nanowire
Physics::Optics
Bioengineering
02 engineering and technology
law.invention
Optics
law
General Materials Science
Image resolution
X-ray beam induced current
detector
business.industry
Mechanical Engineering
Resolution (electron density)
General Chemistry
021001 nanoscience & nanotechnology
Condensed Matter Physics
Synchrotron
Ptychography
Optical axis
Beamline
nanofocused X-rays
0210 nano-technology
business
Subjects
Details
- ISSN :
- 15306992 and 15306984
- Volume :
- 20
- Database :
- OpenAIRE
- Journal :
- Nano Letters
- Accession number :
- edsair.doi.dedup.....7bca5002b97b290d58fc40326f98e646