Cite
Cryogenic Operation of Thin-Film FDSOI nMOS Transistors: The Effect of Back Bias on Drain Current and Transconductance
MLA
Maud Vinet, et al. Cryogenic Operation of Thin-Film FDSOI NMOS Transistors: The Effect of Back Bias on Drain Current and Transconductance. Nov. 2020. EBSCOhost, https://doi.org/10.1109/TED.2020.3022607⟩.
APA
Maud Vinet, Mikael Casse, B. Cardoso Paz, S. De Franceschi, Thierry Poiroux, Sylvain Barraud, Tristan Meunier, F. Gaillard, & Gerard Ghibaudo. (2020). Cryogenic Operation of Thin-Film FDSOI nMOS Transistors: The Effect of Back Bias on Drain Current and Transconductance. https://doi.org/10.1109/TED.2020.3022607⟩
Chicago
Maud Vinet, Mikael Casse, B. Cardoso Paz, S. De Franceschi, Thierry Poiroux, Sylvain Barraud, Tristan Meunier, F. Gaillard, and Gerard Ghibaudo. 2020. “Cryogenic Operation of Thin-Film FDSOI NMOS Transistors: The Effect of Back Bias on Drain Current and Transconductance,” November. doi:10.1109/TED.2020.3022607⟩.