Back to Search
Start Over
Physical vapor deposited zinc oxide nanoparticles for direct electron transfer of superoxide dismutase
- Source :
- Electrochemistry Communications, Vol 10, Iss 5, Pp 818-820 (2008)
- Publication Year :
- 2008
- Publisher :
- Elsevier BV, 2008.
-
Abstract
- This communication describes a novel and facile approach to direct electron transfer of copper, zinc–superoxide dismutase (Cu, Zn–SOD) at a physical vapor deposited zinc oxide (ZnO) nanoparticles surface. SOD exhibits quasi-reversible electrochemical behavior in phosphate buffer solution (PBS, pH 7.25), with apparent formal potential of 195.2 ± 4.6 mV vs. Ag|AgCl and high heterogeneous electron rate constant of 10.4 ± 1.8 s−1. Electrochemical results indicate that SOD stably immobilizes on the nanostructured ZnO film and processes its intrinsic enzymatic activity after adsorbed on ZnO nanoparticles. An electrostatic interaction between SOD with low isoelectric point (pI = 4.9) and ZnO nanoparticles with surface pKa of 9.35 is suggested to be the main force for the adsorption of SOD molecules on the nanostructured ZnO surface, and as a consequence, ZnO nanoparticles surface is favor for direct electron transfer of SOD. The enhanced electron transfer of SOD, together with intrinsic bidirectional catalytic activity of SOD toward superoxide anion (O2-) dismutation paves a way for the development of a third-generation O2- biosensor. Keywords: Electron transfer, Superoxide dismutase, ZnO nanoparticles, Superoxide anion, Physical vapor deposition
- Subjects :
- biology
Scanning electron microscope
Inorganic chemistry
Nanoparticle
chemistry.chemical_element
Zinc
Electrochemistry
Copper
lcsh:Chemistry
Superoxide dismutase
Electron transfer
Adsorption
lcsh:Industrial electrochemistry
lcsh:QD1-999
chemistry
Chemical engineering
biology.protein
lcsh:TP250-261
Subjects
Details
- ISSN :
- 13882481
- Volume :
- 10
- Database :
- OpenAIRE
- Journal :
- Electrochemistry Communications
- Accession number :
- edsair.doi.dedup.....7b2de9edd227e96c82140e42a360be56
- Full Text :
- https://doi.org/10.1016/j.elecom.2008.03.005