Back to Search Start Over

Wet chemical etching of NiFe, NiFeCo and NiMnSb for magnetic device fabrication

Authors :
S. Onishi
J. W. Lee
K.B. Jung
Stephen J. Pearton
J. A. Caballero
J.A. Childress
Xian-An Cao
Source :
Scopus-Elsevier

Abstract

Thin film NiMnSb is found to be wet chemically etched in a range of solutions, including HNO3, H2SO4:H2O2, FeCl3 and HF, with activation energies in the range 10–23 kCal mol−1, i.e. a reaction-limited regime. The degree of sidewall undercut is a function of solution type. Both NiFe and NiFeCo can be etched in H2SO4 and HNO3, with reaction-limited characteristics, while HCl at 25°C is completely selective for NiFe over NiFeCo, even for 7% Co alloys. The degree of sidewall undercut on NiFe is also a strong function of solution type.

Details

Database :
OpenAIRE
Journal :
Scopus-Elsevier
Accession number :
edsair.doi.dedup.....78eb3f25599beddb67808e8fcef8a557