Back to Search
Start Over
Design and evaluation of AC-coupled, FOXFET-biased, 'edge-on' silicon strip detectors for X-ray imaging
- Publication Year :
- 1997
-
Abstract
- A silicon strip detector for the SYRMEP (SYnchrotron Radiation for MEdical Physics) experiment has been designed and realised. The main features of this detector are AC-coupling through integrated coupling capacitors, DC bias of the strips by means of a gated punch-through structure, bulk contact on the junction side through a forward-biased p + implant, thinned entrance window for the incoming radiation (in an “edge-on” geometry) and integrated fan-in on active silicon. Results of laboratory tests of the detector parameters, allowing a thorough evaluation of the technological solutions employed, are presented.
- Subjects :
- Nuclear and High Energy Physics
Silicon
Physics::Instrumentation and Detectors
silicon strip detector
chemistry.chemical_element
Synchrotron radiation
FIS/07 - FISICA APPLICATA (A BENI CULTURALI, AMBIENTALI, BIOLOGIA E MEDICINA)
STRIPS
FOXFET biased
Radiation
law.invention
Optics
SYRMEP
law
digital mammography
AC-coupled, FOXFET-biased, silicon strip detector, X-ray imaging
Instrumentation
Capacitive coupling
Physics
AC coupled
business.industry
Detector
Capacitor
chemistry
business
DC bias
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Accession number :
- edsair.doi.dedup.....7729cc51eaeb70f8697608c04907ab84