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THz detectors based on Si-CMOS technology field effect transistors – advantages, limitations and perspectives for THz imaging and spectroscopy
- Source :
- Opto-Electronics Review, Opto-Electronics Review, Springer Verlag, 2018, 26 (4), pp.261. ⟨10.1016/j.opelre.2018.08.002⟩
- Publication Year :
- 2018
- Publisher :
- Polish Academy of Sciences Chancellery, 2018.
-
Abstract
- International audience; Recent advances in THz detection with the use of CMOS technology have shown that this option has the potential to be a leading method of producing low-cost THz sensors with integrated readout systems. This review paper, based on authors’ years of experience, presents strengths and weaknesses of this solution. The article gives examples of some hints, regarding radiation coupling and readout systems. It shows that silicon CMOS technology is well adapted to the production of inexpensive imaging systems for sub-THz frequencies. As an example paper presents the demonstrator of a multipixel Si-CMOS THz spectroscopic system allowing for chemical identification of lactose. The THz detectors embedded in this system were manufactured using the CMOS process.
- Subjects :
- Coupling
Radiation
Materials science
business.industry
Terahertz radiation
Detector
020206 networking & telecommunications
02 engineering and technology
021001 nanoscience & nanotechnology
[PHYS.PHYS.PHYS-GEN-PH]Physics [physics]/Physics [physics]/General Physics [physics.gen-ph]
CMOS
0202 electrical engineering, electronic engineering, information engineering
Optoelectronics
General Materials Science
Field-effect transistor
Electrical and Electronic Engineering
0210 nano-technology
business
Spectroscopy
Cmos process
Thz spectroscopy
Subjects
Details
- ISSN :
- 12303402
- Volume :
- 26
- Database :
- OpenAIRE
- Journal :
- Opto-Electronics Review
- Accession number :
- edsair.doi.dedup.....73a744415c1de4d0d3f3c759ab674163
- Full Text :
- https://doi.org/10.1016/j.opelre.2018.08.002