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THz detectors based on Si-CMOS technology field effect transistors – advantages, limitations and perspectives for THz imaging and spectroscopy

Authors :
Dominique Coquillat
Jacek Marczewski
D. Obrebski
D. Yavorskiy
Przemyslaw Zagrajek
Pawel Kopyt
Cezary Kolacinski
Krzysztof Kucharski
Norbert Palka
Radoslaw Ryniec
Wojciech Knap
Daniel Tomaszewski
J. Lusakowski
Laboratoire Charles Coulomb (L2C)
Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)
Institute of Experimental Physics [Warsaw] (IFD)
Faculty of Physics [Warsaw] (FUW)
University of Warsaw (UW)-University of Warsaw (UW)
Source :
Opto-Electronics Review, Opto-Electronics Review, Springer Verlag, 2018, 26 (4), pp.261. ⟨10.1016/j.opelre.2018.08.002⟩
Publication Year :
2018
Publisher :
Polish Academy of Sciences Chancellery, 2018.

Abstract

International audience; Recent advances in THz detection with the use of CMOS technology have shown that this option has the potential to be a leading method of producing low-cost THz sensors with integrated readout systems. This review paper, based on authors’ years of experience, presents strengths and weaknesses of this solution. The article gives examples of some hints, regarding radiation coupling and readout systems. It shows that silicon CMOS technology is well adapted to the production of inexpensive imaging systems for sub-THz frequencies. As an example paper presents the demonstrator of a multipixel Si-CMOS THz spectroscopic system allowing for chemical identification of lactose. The THz detectors embedded in this system were manufactured using the CMOS process.

Details

ISSN :
12303402
Volume :
26
Database :
OpenAIRE
Journal :
Opto-Electronics Review
Accession number :
edsair.doi.dedup.....73a744415c1de4d0d3f3c759ab674163
Full Text :
https://doi.org/10.1016/j.opelre.2018.08.002