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Revealing the local crystallinity of single silicon core–shell nanowires using tip-enhanced Raman spectroscopy
- Source :
- Beilstein Journal of Nanotechnology, Vol 11, Iss 1, Pp 1147-1156 (2020), Beilstein Journal of Nanotechnology
- Publication Year :
- 2020
- Publisher :
- Beilstein-Institut, 2020.
-
Abstract
- Tip-enhanced Raman spectroscopy is combined with polarization angle-resolved spectroscopy to investigate the nanometre-scale structural properties of core-shell silicon nanowires (crystalline Si core and amorphous Si shell), which were synthesized by platinum-catalyzed vapor-liquid-solid growth and silicon overcoating by thermal chemical vapour deposition. Local changes in the fraction of crystallinity are characterized for those silicon nanowires at an optical resolution of about 300 nm. Furthermore, we are able to resolve the variations in the intensity ratios between the crystalline Si and the amorphous Si Raman peaks by applying tip-enhanced Raman spectroscopy, at sample positions being eight nanometers apart. The local crystallinity revealed using confocal Raman spectroscopy and tip-enhanced Raman spectroscopy agree well with the high-resolution transmission electron microscopy measurements. Additionally, the polarizations of Raman scattering and the photoluminescence signal from the tip-sample nanogap are explored by combining polarization angle-resolved emission spectroscopy with tip-enhanced optical spectroscopy. Our work demonstrates the significant potential of resolving local structural properties of Si nanomaterials at the sub-10 nanometer scale using tip-enhanced Raman techniques.
- Subjects :
- Materials science
Silicon
Nanowire
General Physics and Astronomy
chemistry.chemical_element
02 engineering and technology
Chemical vapor deposition
010402 general chemistry
lcsh:Chemical technology
01 natural sciences
lcsh:Technology
Full Research Paper
local crystallinity
Crystallinity
symbols.namesake
Condensed Matter::Materials Science
Nanotechnology
General Materials Science
lcsh:TP1-1185
Electrical and Electronic Engineering
Spectroscopy
lcsh:Science
polarization angle-resolved spectroscopy
business.industry
lcsh:T
tip-enhanced raman spectroscopy
silicon
021001 nanoscience & nanotechnology
lcsh:QC1-999
0104 chemical sciences
Amorphous solid
Nanoscience
chemistry
symbols
Optoelectronics
lcsh:Q
0210 nano-technology
business
Raman spectroscopy
core–shell nanowires
Raman scattering
lcsh:Physics
Subjects
Details
- Language :
- English
- ISSN :
- 21904286
- Volume :
- 11
- Issue :
- 1
- Database :
- OpenAIRE
- Journal :
- Beilstein Journal of Nanotechnology
- Accession number :
- edsair.doi.dedup.....6fb4404ed52ae3b3d6fe61f3b2075348