On Test Generation for Microprocessors for Extended Class of Functional Faults

MLA

Raimund Ubar, et al. On Test Generation for Microprocessors for Extended Class of Functional Faults. Oct. 2019. EBSCOhost, https://doi.org/10.1007/978-3-030-53273-4_2⟩.

APA

Raimund Ubar, Adeboye Stephen Oyeniran, Jaan Raik, & Maksim Jenihhin. (2019). On Test Generation for Microprocessors for Extended Class of Functional Faults. https://doi.org/10.1007/978-3-030-53273-4_2⟩

Chicago

Raimund Ubar, Adeboye Stephen Oyeniran, Jaan Raik, and Maksim Jenihhin. 2019. “On Test Generation for Microprocessors for Extended Class of Functional Faults,” October. doi:10.1007/978-3-030-53273-4_2⟩.