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Graphene-HfO2-based resistive RAM memories

Authors :
Patrice Gonon
Caroline Rabot
Alexandru Delamoreanu
Vincent Jousseaume
Laurence Latu-Romain
Christophe Vallée
Sylvain David
H. Grampeix
C. Mannequin
Aziz Zenasni
Laboratoire des technologies de la microélectronique (LTM )
Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])
Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI)
Direction de Recherche Technologique (CEA) (DRT (CEA))
Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)
Science et Ingénierie des Matériaux et Procédés (SIMaP )
Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])
Institut d'électronique fondamentale (IEF)
Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)
Source :
Microelectronic Engineering, Microelectronic Engineering, 2016, 161, pp.82-86. ⟨10.1016/j.mee.2016.04.009⟩, Microelectronic Engineering, Elsevier, 2016, 161, pp.82-86. ⟨10.1016/j.mee.2016.04.009⟩
Publication Year :
2016
Publisher :
HAL CCSD, 2016.

Abstract

International audience; Graphene, a two dimensional material with remarkable electronic properties, has attracted a huge interest among scientist during the last decade. We report the fabrication of Graphene-HfO2-based resistive RAM memories. We insert graphene layers between the oxide layer and the gold top electrode resulting in stabilization of a low resistance state stability without applied voltage, contrary to behaviour observed for identical graphene free memory devices. Graphene here is used as an oxygen reservoir and contribute to the switching mechanism. (C) 2016 Elsevier B.V. All rights reserved.

Details

Language :
English
ISSN :
01679317 and 18735568
Database :
OpenAIRE
Journal :
Microelectronic Engineering, Microelectronic Engineering, 2016, 161, pp.82-86. ⟨10.1016/j.mee.2016.04.009⟩, Microelectronic Engineering, Elsevier, 2016, 161, pp.82-86. ⟨10.1016/j.mee.2016.04.009⟩
Accession number :
edsair.doi.dedup.....639048c5ae483e9338f96d7eb1187cb6