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Correlative Investigations by HAADF-STEM and Atom Probe Tomography
- Source :
- European Microscopy Congress, European Microscopy Congress, Aug 2016, Lyon, France. pp.775-776, ⟨10.1002/9783527808465.EMC2016.8364⟩
- Publication Year :
- 2016
- Publisher :
- HAL CCSD, 2016.
-
Abstract
- International audience
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- European Microscopy Congress, European Microscopy Congress, Aug 2016, Lyon, France. pp.775-776, ⟨10.1002/9783527808465.EMC2016.8364⟩
- Accession number :
- edsair.doi.dedup.....6332e5c064a90031b62adb81392d0a0a
- Full Text :
- https://doi.org/10.1002/9783527808465.EMC2016.8364⟩