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Robust Entanglement Gates for Trapped-Ion Qubits

Authors :
Tom Manovitz
Roee Ozeri
Yotam Shapira
Ravid Shaniv
Nitzan Akerman
Source :
Physical Review Letters. 121
Publication Year :
2018
Publisher :
American Physical Society (APS), 2018.

Abstract

High-fidelity two-qubit entangling gates play an important role in many quantum information processing tasks and are a necessary building block for constructing a universal quantum computer. Such high-fidelity gates have been demonstrated on trapped-ion qubits, however, control errors and noise in gate parameters may still lead to reduced fidelity. Here we propose and demonstrate a general family of two-qubit entangling gates which are robust to different sources of noise and control errors. These gates generalize the celebrated M{\o}lmer-S{\o}rensen gate by using multi-tone drives. We experimentally implemented several of the proposed gates on $^{88}\text{Sr}^{+}$ ions trapped in a linear Paul trap, and verified their resilience.<br />Comment: Main text - 5 pages, 5 figures, Supplemental Materials - 3 pages, 3 figures

Details

ISSN :
10797114 and 00319007
Volume :
121
Database :
OpenAIRE
Journal :
Physical Review Letters
Accession number :
edsair.doi.dedup.....5d35beb8933528a28b2453e03ba2cc91