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High-pressure Raman scattering in InGaN heteroepitaxial layers: Effect of the substrate on the phonon pressure coefficients
- Source :
- Digital.CSIC. Repositorio Institucional del CSIC, instname
- Publication Year :
- 2014
- Publisher :
- AIP Publishing, 2014.
-
Abstract
- We perform high-pressure Raman-scattering measurements on different In xGa1-xN/Si(111) epilayers (0.19 < x < 0.45). We find that the experimental pressure coefficient of the A 1(LO) mode measured in these samples is larger than that expected from the linear interpolation between the corresponding values of GaN and InN. Similar measurements in InGaN epilayers grown on GaN/sapphire templates yield much lower values, below the linearly interpolated pressure coefficients. We conclude that the phonon pressure coefficients measured in InGaN are mainly determined by the different compressibility of the substrate and epilayer material. Neglecting substrate effects may yield highly inaccurate phonon pressure coefficients and mode Grüneisen parameters.<br />The work was supported by the Spanish Ministry of Economy and Competitiveness (MINECO) under project MAT2010-16116.
- Subjects :
- Yield (engineering)
Materials science
Physics and Astronomy (miscellaneous)
High pressure effects
Phonon
Substrate (electronics)
Epitaxy
Pressure coefficient
symbols.namesake
Linear Interpolation
Substrate effects
Epitaxial growth
InGaN epilayers
Condensed matter physics
business.industry
Epilayers
Heteroepitaxial layers
Wide-bandgap semiconductor
GaN/sapphire
Pressure coefficients
symbols
Phonons
Optoelectronics
business
Raman spectroscopy
Raman scattering
Subjects
Details
- ISSN :
- 10773118 and 00036951
- Volume :
- 104
- Database :
- OpenAIRE
- Journal :
- Applied Physics Letters
- Accession number :
- edsair.doi.dedup.....5ccf2fa6466fc1c36f7258a5724a35d2