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Interaction of ultrashort X-ray pulses with B4C, SiC and Si

Authors :
M. Bergh
Nicusor Timneanu
Howard A. Scott
Stefan P. Hau-Riege
Source :
Physical review / E 77(2), 026404 (2008). doi:10.1103/PhysRevE.77.026404, arXiv E-Print (only) (2007).
Publication Year :
2007

Abstract

The interaction of 32.5 and 6 nm ultrashort X-ray pulses with the solid materials B4C, SiC and Si is simulated with a non-local thermodynamic equilibrium (NLTE) radiation transfer code. We study the ionization dynamics as function of depth in the material, modifications of the opacity during irradiation and estimate crater depth. Furthermore, we compare the estimated crater depth with experimental data, for fluences up to 2.2 J/cm2. Our results show that at 32.5 nm irradiation, the opacity changes with less than a factor of 2 for B4C and Si and a factor of 3 for SiC, for fluences up to 200 J/cm2. At a laser wavelength of 6 nm, the model predicts a dramatic decrease in opacity due to the weak inverse bremsstrahlung, increasing the crater depth for high fluences.<br />9 pages, 9 color figures

Details

Language :
English
Database :
OpenAIRE
Journal :
Physical review / E 77(2), 026404 (2008). doi:10.1103/PhysRevE.77.026404, arXiv E-Print (only) (2007).
Accession number :
edsair.doi.dedup.....5c81975cdf8558305196ed6e0ac63ff8
Full Text :
https://doi.org/10.1103/PhysRevE.77.026404