Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids

Authors :: Jaroslav Kuba
Richard M. Bionta
Jacek Krzywinski
J. Meyer-ter-Vehn
M. Bergh
Josef Krasa
Ryszard Sobierajski
Andriy Velyhan
Jerzy B. Pelka
Robert Nietubyć
Nikola Stojanovic
S. Koptyaev
J. Cihelka
Ulf Zastrau
Marek Jurek
Stefan P. Hau-Riege
Věra Hájková
Sven Toleikis
Klaus Sokolowski-Tinten
Henry N. Chapman
Kai Tiedtke
Janos Hajdu
Richard A. London
Jaromir Chalupsky
Carl Caleman
Libor Juha
Thomas Tschentscher
A. Tronnier
H. Wabnitz
Source :: Optics express 15, 6036-6043 (2007). doi:10.1364/OE.15.006036
Publication Year :: 2009
Abstract: A linear accelerator based source of coherent radiation, FLASH (Free-electron LASer in Hamburg) provides ultra-intense femtosecond radiation pulses at wavelengths from the extreme ultraviolet (XUV; lambda< 100nm) to the soft X-ray (SXR; lambda

Subjects :: Materials science
business.industry
Attenuation length
Free-electron laser
Synchrotron radiation
Radiation
Laser
Atomic and Molecular Physics, and Optics
law.invention
Optics
law
Extreme ultraviolet
Femtosecond
Optoelectronics
ddc:530
Irradiation
business

Tools