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A robust ultra-low voltage CPU utilizing timing-error prevention

Authors :
Matti Sopanen
Arto Rantala
Jani Makipaa
Markus Hiienkari
Jukka Teittinen
Lauri Koskinen
Matthew Turnquist
Mikko Kaltiokallio
Department of Micro and Nanosciences
TDK Nordic
Aalto-yliopisto
Aalto University
Source :
Journal of Low Power Electronics and Applications, Volume 5, Issue 2, Pages 57-68, Journal of Low Power Electronics and Applications, Vol 5, Iss 2, Pp 57-68 (2015), Hiiekari, M, Teittinen, J, Koskinen, L, Turnquist, M J, Mäkipää, J, Rantala, A, Sopanen, M & Kaltiokallio, M 2015, ' A robust ultra-low voltage CPU utilizing timing-error prevention ', Journal of Low Power Electronics and Applications, vol. 5, no. 2, pp. 57-68 . https://doi.org/10.3390/jlpea5020057
Publication Year :
2015

Abstract

To minimize energy consumption of a digital circuit, logic can be operated at sub- or near-threshold voltage. Operation at this region is challenging due to device and environment variations, and resulting performance may not be adequate to all applications. This article presents two variants of a 32-bit RISC CPU targeted for near-threshold voltage. Both CPUs are placed on the same die and manufactured in 28 nm CMOS process. They employ timing-error prevention with clock stretching to enable operation with minimal safety margins while maximizing performance and energy efficiency at a given operating point. Measurements show minimum energy of 3.15 pJ/cyc at 400 mV, which corresponds to 39% energy saving compared to operation based on static signoff timing. © 2015 by the authors; licensee MDPI, Basel, Switzerland.

Details

Language :
English
Database :
OpenAIRE
Journal :
Journal of Low Power Electronics and Applications, Volume 5, Issue 2, Pages 57-68, Journal of Low Power Electronics and Applications, Vol 5, Iss 2, Pp 57-68 (2015), Hiiekari, M, Teittinen, J, Koskinen, L, Turnquist, M J, Mäkipää, J, Rantala, A, Sopanen, M & Kaltiokallio, M 2015, ' A robust ultra-low voltage CPU utilizing timing-error prevention ', Journal of Low Power Electronics and Applications, vol. 5, no. 2, pp. 57-68 . https://doi.org/10.3390/jlpea5020057
Accession number :
edsair.doi.dedup.....59c06609dfadcb784b0149de8ea86e6b
Full Text :
https://doi.org/10.3390/jlpea5020057