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Reliability-driven pin assignment optimization to improve in-orbit soft-error rate
- Source :
- Microelectronics Reliability, Microelectronics Reliability, 2020, 114, pp.113885. ⟨10.1016/j.microrel.2020.113885⟩, Microelectronics Reliability, Elsevier, 2020, 114, pp.113885. ⟨10.1016/j.microrel.2020.113885⟩
- Publication Year :
- 2020
- Publisher :
- HAL CCSD, 2020.
-
Abstract
- International audience; Electronics are increasingly susceptible to energetic particle interactions within the silicon. In order to improve the circuit reliability under radiation effects, several hardening techniques have been adopted in the design flow of VLSI systems. This paper proposes a pin assignment optimization in logic gates to reduce the Single-Event Transient (SET) cross-section and improve the in-orbit soft-error rate. Signal probability propagation is used to assign the lowest probability to the most sensitive input combination of the circuit by rewiring or pin swapping. The cell optimization can reach up to 48% reduction on the soft-error rate. For the analyzed arithmetic benchmark circuits, an optimized cell netlist can achieve from 8% to 28% reduction on the SET crosssection and in-orbit soft-error rate at no cost in the circuit design area. Additionally, as the pin swapping is a layout-friendly technique, the optimization does not impact on the cell placement and it can be adopted along with other hardening techniques in the logic and physical synthesis.
- Subjects :
- Technology
Computer science
Circuit design
Design flow
02 engineering and technology
Hardware_PERFORMANCEANDRELIABILITY
01 natural sciences
Physics, Applied
Engineering
0103 physical sciences
0202 electrical engineering, electronic engineering, information engineering
Electronic engineering
Hardware_INTEGRATEDCIRCUITS
Nanoscience & Nanotechnology
Electrical and Electronic Engineering
[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
Safety, Risk, Reliability and Quality
Electronic circuit
010302 applied physics
Science & Technology
Physics
020208 electrical & electronic engineering
Engineering, Electrical & Electronic
Condensed Matter Physics
Circuit reliability
Atomic and Molecular Physics, and Optics
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Soft error
Logic gate
Physical Sciences
LAYOUT
Netlist
Benchmark (computing)
Science & Technology - Other Topics
SIGNAL PROBABILITY
Hardware_LOGICDESIGN
Subjects
Details
- Language :
- English
- ISSN :
- 00262714
- Database :
- OpenAIRE
- Journal :
- Microelectronics Reliability, Microelectronics Reliability, 2020, 114, pp.113885. ⟨10.1016/j.microrel.2020.113885⟩, Microelectronics Reliability, Elsevier, 2020, 114, pp.113885. ⟨10.1016/j.microrel.2020.113885⟩
- Accession number :
- edsair.doi.dedup.....58c608961a6e8f35e02d9881774b2846