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A UHV MOKE magnetometer complementing XMCD-PEEM at the Elettra Synchrotron
- Source :
- Journal of Synchrotron Radiation
- Publication Year :
- 2021
- Publisher :
- International Union of Crystallography (IUCr), 2021.
-
Abstract
- A UHV-compatible MOKE magnetometer for in situ studies operating in tandem with the PEEM at the Nanospectroscopy beamline of the Elettra synchrotron.<br />We report on a custom-built UHV-compatible Magneto-Optical Kerr Effect (MOKE) magnetometer for applications in surface and materials sciences, operating in tandem with the PhotoEmission Electron Microscope (PEEM) endstation at the Nanospectroscopy beamline of the Elettra synchrotron. The magnetometer features a liquid-nitrogen-cooled electromagnet that is fully compatible with UHV operation and produces magnetic fields up to about 140 mT at the sample. Longitudinal and polar MOKE measurement geometries are realized. The magneto-optical detection is based on polarization analysis using a photoelastic modulator. The sample manipulation system is fully compatible with that of the PEEM, making it possible to exchange samples with the beamline endstation, where complementary X-ray imaging and spectroscopy techniques are available. The magnetometer performance is illustrated by experiments on cobalt ultra-thin films, demonstrating close to monolayer sensitivity. The advantages of combining in situ growth, X-ray Magnetic Circular Dichroism imaging (XMCD-PEEM) and MOKE magnetometry into a versatile multitechnique facility are highlighted.
- Subjects :
- Nuclear and High Energy Physics
Materials science
Kerr effect
MOKE magnetometry
Magnetometer
02 engineering and technology
01 natural sciences
Settore FIS/03 - Fisica della Materia
law.invention
In situ studies
Magneto-Optical Kerr Effect
SPELEEM
XMCD-PEEM
law
0103 physical sciences
010306 general physics
Instrumentation
Radiation
Photoelastic modulator
Electromagnet
business.industry
Magnetic circular dichroism
Beamlines
021001 nanoscience & nanotechnology
Polarization (waves)
Synchrotron
Beamline
in situ studies
Optoelectronics
0210 nano-technology
business
Subjects
Details
- ISSN :
- 16005775
- Volume :
- 28
- Database :
- OpenAIRE
- Journal :
- Journal of Synchrotron Radiation
- Accession number :
- edsair.doi.dedup.....589d10caa9e0b87524be9f7031dd121b
- Full Text :
- https://doi.org/10.1107/s1600577521002885