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Room temperature thin foil SLIM-cut using an epoxy paste: experimental versus theoretical results

Authors :
Marc Bernacki
Pierre-Olivier Bouchard
João Serra
P. Bellanger
Faculdade de Ciências [Lisboa]
Universidade de Lisboa (ULISBOA)
Centre de Mise en Forme des Matériaux (CEMEF)
MINES ParisTech - École nationale supérieure des mines de Paris
Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Centre National de la Recherche Scientifique (CNRS)
Source :
Materials Research Express, Materials Research Express, IOP Publishing Ltd, 2015, 2 (4), pp.046203. ⟨10.1088/2053-1591/2/4/046203⟩
Publication Year :
2015
Publisher :
HAL CCSD, 2015.

Abstract

International audience; The stress induced lift-off method (SLIM) -cut technique allows the detachment of thin silicon foils using a stress inducing layer. In this work, results of SLIM-cut foils obtained using an epoxy stress inducing layer at room temperature are presented. Numerical analyses were performed in order to study and ascertain the important experimental parameters. The experimental and simulation results are in good agreement. Indeed, large area (5 × 5 cm2) foils were successfully detached at room temperature using an epoxy thickness of 900 μm and a curing temperature of 150 °C. Moreover, three foils (5 × 3 cm2) with thickness 135, 121 and 110 μm were detached from the same monocrystalline substrate. Effective minority carrier lifetimes of 46, 25 and 20 μs were measured using quasi-steady-state photoconductance technique in these foils after iodine ethanol surface passivation.

Details

Language :
English
ISSN :
20531591
Database :
OpenAIRE
Journal :
Materials Research Express, Materials Research Express, IOP Publishing Ltd, 2015, 2 (4), pp.046203. ⟨10.1088/2053-1591/2/4/046203⟩
Accession number :
edsair.doi.dedup.....579abf49b46eff06ae736cb375204b65
Full Text :
https://doi.org/10.1088/2053-1591/2/4/046203⟩