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Metallized SU-8 thin film patterns on stretchable PDMS

Authors :
Tiffany Baëtens
Vincent Thomy
Emiliano Pallecchi
Steve Arscott
Laboratoire Pierre Aigrain (LPA)
Université Pierre et Marie Curie - Paris 6 (UPMC)-Université Paris Diderot - Paris 7 (UPD7)-Fédération de recherche du Département de physique de l'Ecole Normale Supérieure - ENS Paris (FRDPENS)
Centre National de la Recherche Scientifique (CNRS)-École normale supérieure - Paris (ENS Paris)
Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Centre National de la Recherche Scientifique (CNRS)-École normale supérieure - Paris (ENS Paris)
Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Centre National de la Recherche Scientifique (CNRS)
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN)
Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)
Bio-Micro-Electro-Mechanical Systems - IEMN (BIOMEMS - IEMN)
Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)
Nano and Microsystems - IEMN (NAM6 - IEMN)
Renatech Network
ANR-16-CE09-0029,TIPTOP_1,Fabrication de leviers de microscopie à force atomique pour des applications de spectroscopie Raman à exaltation de pointe(2016)
ANR-11-EQPX-0025,LEAF,Plateforme de traitement laser pour l'électronique flexible multifonctionnelle(2011)
Fédération de recherche du Département de physique de l'Ecole Normale Supérieure - ENS Paris (FRDPENS)
École normale supérieure - Paris (ENS-PSL)
Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Centre National de la Recherche Scientifique (CNRS)-École normale supérieure - Paris (ENS-PSL)
Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Centre National de la Recherche Scientifique (CNRS)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Université Paris Diderot - Paris 7 (UPD7)-Centre National de la Recherche Scientifique (CNRS)
A c k n o w l e d g m e n t s :The authors would very much like to thank Annie Fattorini and Marc Dewitte for help with the metallization, Christophe Boyaval for help with the SEM, and Flavie Braud for help in fabricating the physical masks using a Tangerine laser machining system (Amplitude Systèmes, France) purchased within the EQUIPEX ‘LEAF’ project (ANR-11-EQPX-0025). The digital microscope was purchased within the ‘TIPTOP_1’ project (ANR-16-CE09-0029). This work was partially supported by the French RENATECH network
Source :
Journal of Micromechanics and Microengineering, Journal of Micromechanics and Microengineering, IOP Publishing, 2019, 29 (9), pp.095009. ⟨10.1088/1361-6439/ab307f⟩, Journal of Micromechanics and Microengineering, 2019, 29 (9), pp.095009. ⟨10.1088/1361-6439/ab307f⟩
Publication Year :
2019
Publisher :
HAL CCSD, 2019.

Abstract

We show how a rigid patterned SU-8 thin film in tandem with the mechanical Poisson effect can be used beneficially to enable robust metallization on stretchable polydimethylsiloxane (PDMS). Two generic planar processes used to form a thin, mechanically-robust strain-shielding photoresist on a soft substrate are developed to demonstrate these ideas. The first process is a self-aligned metallization of photolithographically patterned SU-8 features on PDMS. The second process is a fully photolithographic lift-off metallization of pre-patterned SU-8 features on PDMS. In both cases, the SU-8 has a sub-micrometre thickness (~800 nm)?supporting a thermally evaporated Ti/Au (5 nm/50 nm) thin film metallization. The resulting samples were characterized electromechanically?the results demonstrate that the electrical continuity of metal lines (width = 150 ?m and length up to 1 cm) is maintained up to ~70% strain between the lines. The electrical resistance of such lines remains relatively stable: 35 ? at zero-strain and 63 ? at 69% average interline strain. The electrical resistivity of the evaporated gold is near to that of pure gold, and remains so even at high strains (49 n? m at 10% and 70 n? m at 41%)?this proves the absence strain-induced micro-cracking of the metal lines. Although a specific evaporated metal combination is used here to demonstrate a working prototype system, in principle, any thin-film material, which can be deposited by microfabrication, e.g. insulators, semiconductors..., could be integrated into the generic processes. The basic lithographic processes expounded here are also potentially extendible to encompass the integration of other microfabrication techniques, e.g. soft lithography, contact printing..., enabling more complex flexible systems to be envisaged and realized.

Details

Language :
English
ISSN :
09601317 and 13616439
Database :
OpenAIRE
Journal :
Journal of Micromechanics and Microengineering, Journal of Micromechanics and Microengineering, IOP Publishing, 2019, 29 (9), pp.095009. ⟨10.1088/1361-6439/ab307f⟩, Journal of Micromechanics and Microengineering, 2019, 29 (9), pp.095009. ⟨10.1088/1361-6439/ab307f⟩
Accession number :
edsair.doi.dedup.....575d9167e5ef5d2bfbab78db0da8ede8
Full Text :
https://doi.org/10.1088/1361-6439/ab307f⟩