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Secondary Electrons Characterization of Hydrogenated Dilute Nitrides
- Source :
- EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ISBN: 9783540851547, 14th European Microscopy Congress EMC2008, Sept. 15, 2008, Aachen (Germany), Aachen, 2008, info:cnr-pdr/source/autori:L. Felisari; V. Grillo; S. Rubini; F. Martelli; R. Trotta; A. Polimeni; M. Capizzi; L. Mariucci/congresso_nome:14th European Microscopy Congress EMC2008, Sept. 15, 2008, Aachen (Germany)/congresso_luogo:Aachen/congresso_data:2008/anno:2008/pagina_da:/pagina_a:/intervallo_pagine
- Publication Year :
- 2009
- Publisher :
- Springer Berlin Heidelberg, 2009.
-
Abstract
- Dilute nitrides alloys, as GaAsxN1−x, have been extensively studied in the last few years since the presence of small amounts of N in III–V semiconductors leads to major changes in the physical properties of the host materials. In particular, the strong reduction of band gap induced by N enables important technological applications in the field of active optical devices and microelectronics.
Details
- ISBN :
- 978-3-540-85154-7
- ISBNs :
- 9783540851547
- Database :
- OpenAIRE
- Journal :
- EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ISBN: 9783540851547, 14th European Microscopy Congress EMC2008, Sept. 15, 2008, Aachen (Germany), Aachen, 2008, info:cnr-pdr/source/autori:L. Felisari; V. Grillo; S. Rubini; F. Martelli; R. Trotta; A. Polimeni; M. Capizzi; L. Mariucci/congresso_nome:14th European Microscopy Congress EMC2008, Sept. 15, 2008, Aachen (Germany)/congresso_luogo:Aachen/congresso_data:2008/anno:2008/pagina_da:/pagina_a:/intervallo_pagine
- Accession number :
- edsair.doi.dedup.....568cae28e2c8dc97700126a12b0b04e5
- Full Text :
- https://doi.org/10.1007/978-3-540-85156-1_271