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Buried polymer/metal interfaces examined with Kelvin Probe Force Microscopy
- Publication Year :
- 2013
-
Abstract
- Device performance in organic electronics depends on electronic properties of buried interfaces between thin (
- Subjects :
- Materials science
ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION
Nanotechnology
metal surface
polystyrene
Kelvin Probe Force Microscopy
buried interface
polyaniline
chemistry.chemical_compound
Polyaniline
Microscopy
Materials Chemistry
chemistry.chemical_classification
Kelvin probe force microscope
Organic electronics
Metals and Alloys
self-assembled monolayers
thin polymer film
Self-assembled monolayer
Surfaces and Interfaces
Polymer
polymer blend
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
ComputingMethodologies_PATTERNRECOGNITION
chemistry
Polymer blend
Polystyrene
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Accession number :
- edsair.doi.dedup.....529ae7602b3cceb7ee413773ee9ca2d0