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Emotion Recognition and Adverse Childhood Experiences in Individuals at Clinical High Risk of Psychosis

Authors :
Merete Nordentoft
Ana Catalan
Marie-Odile Krebs
Mark van der Gaag
Christos Pantelis
Lieuwe de Haan
Lucia Valmaggia
Matthew J. Kempton
Philip McGuire
Barnaby Nelson
Gabriele Sachs
Anita Riecher-Rössler
Stephan Ruhrmann
Neus Barrantes-Vidal
Rodrigo A. Bressan
Jim van Os
Bart P. F. Rutten
Stefania Tognin
Amaia Bilbao
Gemma Modinos
Eu-Gei High Risk Study
Adult Psychiatry
Amsterdam Neuroscience - Mood, Anxiety, Psychosis, Stress & Sleep
APH - Mental Health
MUMC+: MA Psychiatrie (3)
Psychiatrie & Neuropsychologie
RS: MHeNs - R3 - Neuroscience
RS: MHeNs - R2 - Mental Health
MUMC+: Hersen en Zenuw Centrum (3)
Clinical Psychology
Source :
Schizophrenia bulletin, 46(4), 823-833. Oxford University Press, Schizophr Bull, Schizophrenia Bulletin, 46(4), 823-833. Oxford University Press, EU-GEI High Risk Study 2020, ' Emotion Recognition and Adverse Childhood Experiences in Individuals at Clinical High Risk of Psychosis ', Schizophrenia bulletin, vol. 46, no. 4, pp. 823-833 . https://doi.org/10.1093/schbul/sbz128
Publication Year :
2020
Publisher :
Oxford University Press, 2020.

Abstract

ObjectiveTo investigate the association between facial affect recognition (FAR) and type of adverse childhood experiences (ACEs) in a sample of clinical high risk (CHR) individuals and a matched sample of healthy controls (HCs).MethodsIn total, 309 CHR individuals and 51 HC were recruited as part of an European Union-funded multicenter study (EU-GEI) and included in this work. During a 2-year follow-up period, 65 CHR participants made a transition to psychosis (CHR-T) and 279 did not (CHR-NT). FAR ability was measured using a computerized version of the Degraded Facial Affect Recognition (DFAR) task. ACEs were measured using the Childhood Experience of Care and Abuse Questionnaire, the Childhood Trauma Questionnaire, and the Bullying Questionnaire. Generalized regression models were used to investigate the relationship between ACE and FAR. Logistic regressions were used to investigate the relationship between FAR and psychotic transition.ResultsIn CHR individuals, having experienced emotional abuse was associated with decreased total and neutral DFAR scores. CHR individuals who had experienced bullying performed better in the total DFAR and in the frightened condition. In HC and CHR, having experienced the death of a parent during childhood was associated with lower DFAR total score and lower neutral DFAR score, respectively. Analyses revealed a modest increase of transition risk with increasing mistakes from happy to angry faces.ConclusionsAdverse experiences in childhood seem to have a significant impact on emotional processing in adult life. This information could be helpful in a therapeutic setting where both difficulties in social interactions and adverse experiences are often addressed.

Details

Language :
English
ISSN :
17451701 and 05867614
Volume :
46
Issue :
4
Database :
OpenAIRE
Journal :
Schizophrenia Bulletin
Accession number :
edsair.doi.dedup.....5072910a6e3b8f1de2078eb4fc77ab46
Full Text :
https://doi.org/10.1093/schbul/sbz128