Analysis and modelling of temperature effect on DIBL in UTBB FD SOI MOSFETs

MLA

Michel Haond, et al. “Analysis and Modelling of Temperature Effect on DIBL in UTBB FD SOI MOSFETs.” 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Jan. 2016. EBSCOhost, https://doi.org/10.1109/ulis.2016.7440066.

APA

Michel Haond, Denis Flandre, Valeria Kilchytska, G. de Streel, Nicolas Planes, Renato Giacomini, & A. S. N. Pereira. (2016). Analysis and modelling of temperature effect on DIBL in UTBB FD SOI MOSFETs. 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS). https://doi.org/10.1109/ulis.2016.7440066

Chicago

Michel Haond, Denis Flandre, Valeria Kilchytska, G. de Streel, Nicolas Planes, Renato Giacomini, and A. S. N. Pereira. 2016. “Analysis and Modelling of Temperature Effect on DIBL in UTBB FD SOI MOSFETs.” 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), January. doi:10.1109/ulis.2016.7440066.