Sic Substrate Effects On Electron Transport In The Epitaxial Graphene Layer

WOS: 000333004300012
Hall effect measurements on epitaxial graphene (EG) on SiC substrate have been carried out as a function of temperature. The mobility and concentration of electrons within the two-dimensional electron gas (2DEG) at the EG layers and within the underlying SiC substrate are readily separated and characterized by the simple parallel conduction extraction method (SPCEM). Two electron carriers are identified in the EG/SiC sample: one high-mobility carrier (3493 cm(2)/Vs at 300 K) and one low-mobility carrier (1115 cm(2)/Vs at 300 K). The high mobility carrier can be assigned to the graphene layers. The second carrier has been assigned to the SiC substrate.
project DPT-HAMIT; project ESF-EPIGRAT; project EU-N4E; TUBITAK [107A004, 107A012, 109E301]; Turkish Academy of Sciences; [NATO-SET-181]
This work is supported by the projects DPT-HAMIT, ESF-EPIGRAT, EU-N4E, and NATO-SET-181, and TUBITAK under the Project Nos. 107A004, 107A012, and 109E301. One of the authors (E.O.) also acknowledges partial support from the Turkish Academy of Sciences.