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Towards contact integration for III–V/Silicon heterogeneous photonics devices
- Source :
- 2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), May 2016, San Jose, United States. pp.69-71, ⟨10.1109/IITC-AMC.2016.7507684⟩
- Publication Year :
- 2016
- Publisher :
- IEEE, 2016.
-
Abstract
- International audience; Silicon photonics is of great interest as it opens the way to large bandwidth and high data rates. A pioneer Silicon photonics scheme consists in integrating III-V lasers on the SOI substrates containing the passive components. However, key developments are necessary to co-integrate III-V devices with CMOS very large scale integration (VLSI). In this paper we propose a CMOS-compatible integration scheme of contacts (i.e. semiconductor metallization and plug) on III-V surfaces taking into account the limitations fixed by the operating laser device. Based on metallurgical, morphological, optical and electrical studies, processes are submitted and reviewed for the purpose of forming stable and reproducible contacts with low resistivity in a 200 millimeters fab line.
- Subjects :
- Materials science
Silicon
Hybrid silicon laser
ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION
Silicon on insulator
chemistry.chemical_element
02 engineering and technology
01 natural sciences
020210 optoelectronics & photonics
Heterogeneously integrated III- V laser on Silicon
Silicon Photonics
0103 physical sciences
Hardware_INTEGRATEDCIRCUITS
0202 electrical engineering, electronic engineering, information engineering
[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
010302 applied physics
Silicon photonics
business.industry
Semiconductor
CMOS
chemistry
visual_art
Electronic component
visual_art.visual_art_medium
Optoelectronics
Photonics
business
Contact integration
Subjects
Details
- Database :
- OpenAIRE
- Journal :
- 2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC)
- Accession number :
- edsair.doi.dedup.....4ca389eeed4fc1bf0071391f03e53b69
- Full Text :
- https://doi.org/10.1109/iitc-amc.2016.7507684