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Towards contact integration for III–V/Silicon heterogeneous photonics devices

Authors :
M. Brihoum
Ch. Jany
A. Halimaoui
E. Ghegin
Bertrand Szelag
Isabelle Sagnes
Ph. Rodriguez
Fabrice Nemouchi
STMicroelectronics [Crolles] (ST-CROLLES)
Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI)
Direction de Recherche Technologique (CEA) (DRT (CEA))
Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)
Laboratoire de photonique et de nanostructures (LPN)
Centre National de la Recherche Scientifique (CNRS)
ANR: ANR-10-AIRT-05,Programme Investissements d’Avenir
ANR-10-AIRT-0005,NANOELEC,NANOELEC(2010)
Source :
2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), May 2016, San Jose, United States. pp.69-71, ⟨10.1109/IITC-AMC.2016.7507684⟩
Publication Year :
2016
Publisher :
IEEE, 2016.

Abstract

International audience; Silicon photonics is of great interest as it opens the way to large bandwidth and high data rates. A pioneer Silicon photonics scheme consists in integrating III-V lasers on the SOI substrates containing the passive components. However, key developments are necessary to co-integrate III-V devices with CMOS very large scale integration (VLSI). In this paper we propose a CMOS-compatible integration scheme of contacts (i.e. semiconductor metallization and plug) on III-V surfaces taking into account the limitations fixed by the operating laser device. Based on metallurgical, morphological, optical and electrical studies, processes are submitted and reviewed for the purpose of forming stable and reproducible contacts with low resistivity in a 200 millimeters fab line.

Details

Database :
OpenAIRE
Journal :
2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC)
Accession number :
edsair.doi.dedup.....4ca389eeed4fc1bf0071391f03e53b69
Full Text :
https://doi.org/10.1109/iitc-amc.2016.7507684