A concept of Irradiation Experiments System

In modern high energy physics experiments the electronics modules for controlling and/or data acquisition are very often exposed to various ionising radiation fields. It's well known that it can cause many failures during work of such systems, even total break downs. In such case, the studies of radiation hardness of electronic devices should take place to avoid problems during the lifetime of the experiment. This article describes the idea of a universal modular system, which is under development at Warsaw Univeristy of Technology, to perform radiation experiments of various types of electronic devices. The concept and main advantages of the system are presented and discussed.