A Procedure For Extracting 1/f Noise From Random Telegraph Signals

This work proposes a procedure for separating the 1/f noise from RTS noise in the time domain. The main advantage, respect to other methods, is that it does not assume a single hidden RTS, but it can extract the 1/f component even in presence of several RTS with different corner frequencies. The procedure has been validated through low-frequency noise measurements of the gate current in a MOSFET device.