Back to Search
Start Over
Effective Mitigation of Radiation-induced Single Event Transient on Flash-based FPGAs
- Source :
- ACM Great Lakes Symposium on VLSI
- Publication Year :
- 2017
- Publisher :
- ACM, 2017.
-
Abstract
- Due to the decreasing feature sizes of VLSI circuits, radiation induced Single Event Transients (SETs) are increasingly dominating the event ratio on modern VLSI devices. In particular, Flash-based FPGAs are characterized by the main concern of radiation-induced voltage glitches or SETs in the combinational logic. Transient pulses can be sampled by a storage element and can propagate through the circuit up to the outputs and leading to an error. In this paper, we propose a complete implementation flow including sensitivity analysis, fault tolerant mapping and fault tolerance-oriented place and route for the effective design of SET tolerant circuits on Flash-based FPGAs. In details, the proposed method allows accurate measurement of the transient pulse source induced by radiation particles and estimation of the SET error rate on the overall circuit. Besides the developed method provides a netlist mapping and place and route tool for the selective mitigation of SET effects. The proposed method has been applied to an industrial design oriented to the Euclid European Space Agency mission including more than ten different modules. The obtained results show an improvement of the total filtering capability of around 43 times with respect to the original netlist without affecting the timing constraints of the circuit.
- Subjects :
- Engineering
Fault Tolerance
Flash-based FPGA
Hardware_PERFORMANCEANDRELIABILITY
02 engineering and technology
Fault (power engineering)
01 natural sciences
0103 physical sciences
Hardware_INTEGRATEDCIRCUITS
0202 electrical engineering, electronic engineering, information engineering
Electronic engineering
Field-programmable gate array
Placement
Routing
Electronic circuit
Very-large-scale integration
Combinational logic
Reconfiguration, Design Flow, Placement, Routing, Reliability, Fault Tolerance, Flash-based FPGA
Design Flow
010308 nuclear & particles physics
business.industry
020208 electrical & electronic engineering
Reliability
Reconfiguration
Netlist
Place and route
Transient (oscillation)
business
Subjects
Details
- Database :
- OpenAIRE
- Journal :
- Proceedings of the on Great Lakes Symposium on VLSI 2017
- Accession number :
- edsair.doi.dedup.....4b5a1448a9ab167aa6221fae5f76f41e