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Three-dimensional nanoscale characterisation of materials by atom probe tomography
- Source :
- Devaraj, Arun; Perea, Daniel E; Liu, Jia; Gordon, Lyle M; Prosa, Ty J; Parikh, Pritesh; et al.(2018). Three-dimensional nanoscale characterisation of materials by atom probe tomography. International Materials Reviews, 63(2), 68-101. doi: 10.1080/09506608.2016.1270728. UC San Diego: Retrieved from: http://www.escholarship.org/uc/item/70k8w2kr, INTERNATIONAL MATERIALS REVIEWS, vol 63, iss 2, International Materials Reviews, vol 63, iss 2
- Publication Year :
- 2017
- Publisher :
- Informa UK Limited, 2017.
-
Abstract
- The development of three-dimensional (3-D), characterisation techniques with high spatial and mass resolution is crucial for understanding and developing advanced materials for many engineering applications as well as for understanding natural materials. In recent decades, atom probe tomography (APT), which combines a point projection microscope and time-of-flight mass spectrometer, has evolved to be an excellent characterisation technique capable of providing 3-D nanoscale characterisation of materials with sub-nanometer scale spatial resolution, with equal sensitivity for all elements. This review discusses the current state, as of APT instrumentation, new developments in sample preparation methods, experimental procedures for different material classes, reconstruction of APT results, the current status of correlative microscopy, and application of APT for microstructural characterisation in established scientific areas like structural materials as well as new applications in semiconducting nano...
- Subjects :
- characterisation
Microscope
Materials science
microstructure
Correlative microscopy
Nanotechnology
02 engineering and technology
Atom probe
01 natural sciences
law.invention
law
0103 physical sciences
Nano
Materials Chemistry
Materials
Nanoscopic scale
Image resolution
010302 applied physics
Structural material
Mechanical Engineering
Metals and Alloys
Materials Engineering
021001 nanoscience & nanotechnology
Atom probe tomography
Mechanics of Materials
0210 nano-technology
Point projection
Subjects
Details
- ISSN :
- 17432804 and 09506608
- Volume :
- 63
- Database :
- OpenAIRE
- Journal :
- International Materials Reviews
- Accession number :
- edsair.doi.dedup.....4b1471190011f760c85eba50ba8f0b1e