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EXAFS as a tool for bond-length determination in the environment of heavy atoms

Authors :
M. Rutsch
André Rossberg
Christoph Hennig
Gert Bernhard
Tobias Reich
Harald Funke
Source :
Zeitschrift für Kristallographie (2000)17, 81, Journal of Synchrotron Radiation 8 (2), 695-697 (2001)
Publication Year :
2000

Abstract

Single crystal X-ray diffraction measurements are complicated in the presence of heavy atoms. In these cases the structure factors are mainly influenced by the heavy scatterers and the error in determination of atomic coordinates increases for light atoms. The difficulties grow if the unit cell dimensions or the space group symmetry remain uncertain. If the structure model is similar to the correct structure, it is difficult to find an independent criterion for the accuracy of the bond-length determination. We demonstrate that extended X-ray absorption fine structure (EXAFS) spectroscopy is a useful tool for the investigation of local bond lengths in the environment of heavy atoms.

Details

Language :
English
Database :
OpenAIRE
Journal :
Zeitschrift für Kristallographie (2000)17, 81, Journal of Synchrotron Radiation 8 (2), 695-697 (2001)
Accession number :
edsair.doi.dedup.....496a904c10d4b07bdcadb4e35509eea3