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Long-term capacitance variation characteristics, law extraction, single and collaborative prediction of film capacitors at room temperature and humidity

Authors :
Zhang, Yong Xin
Feng, Qi Kun
Chen, Fang Yi
Liu, Di Fan
Pei, Jia Yao
Zhong, Shao Long
Yang, Zhe
Dang, Zhi Min
Source :
Zhang, Y X, Feng, Q K, Chen, F Y, Liu, D F, Pei, J Y, Zhong, S L, Yang, Z & Dang, Z M 2022, ' Long-term capacitance variation characteristics, law extraction, single and collaborative prediction of film capacitors at room temperature and humidity ', Microelectronics Reliability, vol. 139, 114845 . https://doi.org/10.1016/j.microrel.2022.114845
Publication Year :
2022

Abstract

With the renewable energy application fields of film capacitors gradually expanding, mining film capacitors' data is an important issue. When the aging mechanism and environment are unfamiliar, it will be hard to extract the capacitance's variation law and predict its changes. At the same time, the parallel operation of film capacitor components also brings practical needs and data basis for collaborative prediction. In this work, the capacitance of five film capacitors at room temperature and humidity for 70 days was measured and the characteristics of capacitance variation were analyzed. Then, the capacitance law extraction, single prediction, and collaborative prediction methods for film capacitors were proposed based on the smoothing splines theory. Finally, the effectiveness and application potential of the single prediction and collaborative prediction methods were verified by actual data. The performance of the single prediction and collaborative prediction methods is evaluated by error analysis. The single prediction and collaborative prediction methods proposed in this work can also provide a reference for the prediction and evaluation of other parameters like equivalent series resistance of film capacitors, and help to effectively and accurately explore the aging mechanism.

Details

Language :
English
Database :
OpenAIRE
Journal :
Zhang, Y X, Feng, Q K, Chen, F Y, Liu, D F, Pei, J Y, Zhong, S L, Yang, Z & Dang, Z M 2022, ' Long-term capacitance variation characteristics, law extraction, single and collaborative prediction of film capacitors at room temperature and humidity ', Microelectronics Reliability, vol. 139, 114845 . https://doi.org/10.1016/j.microrel.2022.114845
Accession number :
edsair.doi.dedup.....496353f04f09b2079b6e64717514424d
Full Text :
https://doi.org/10.1016/j.microrel.2022.114845