Crucial Role of the Electron Transport Layer and UV Light on the Open-Circuit Voltage Loss in Inverted Organic Solar Cells

International audience; Understanding the degradation mechanisms in organic photovoltaics is crucial in order to develop stable organic semiconductors and robust device architectures. The rapid loss of efficiency, referred to as burn-in, is a major issue to be addressed. This study reports on the influence of the electron transport layer (ETLs) and UV light on the drop of open-circuit voltage (Voc) for P3HT:PC60BM-based devices. The results show that Voc loss is induced by the UV and, more importantly, that the ETL can amplify it, with TiOx yielding a stronger drop than ZnO. Using impedance spectroscopy (IS) and X-ray photoelectron spectroscopy (XPS), different degradation mechanisms were identified according to whether the ETL is TiOx or ZnO. For TiOx-based devices, the formation of an interface dipole was identified, resulting in a loss of the flat-band potential (Vfb) and, thus, of the Voc. For ZnO-based devices, chemical modifications of the metal oxide and active layer at the interface were detected, resulting in a doping of the active layer which impacts the Voc. This study highlights the role of the architecture and, more specifically, of the ETL in the severity of burn-in and degradation pathways.