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Issues of Impedance Emulation of Converter-Based Grid Emulator for LVRT Test

Authors :
Li, Zejie
Zhao, Fangzhou
Chen, Xingxing
Munk-Nielsen, Stig
Wang, Xiongfei
Source :
Li, Z, Zhao, F, Chen, X, Munk-Nielsen, S & Wang, X 2023, Issues of Impedance Emulation of Converter-Based Grid Emulator for LVRT Test . in 2023 IEEE Applied Power Electronics Conference and Exposition (APEC) . pp. 2741-2746, APEC 2023, Orlando, 19/03/2023 . https://doi.org/10.1109/APEC43580.2023.10131150, Li, Z, Zhao, F, Chen, X, Munk-Nielsen, S & Wang, X 2023, Issues of Impedance Emulation of Converter-Based Grid Emulator for LVRT Test . in APEC 2023-38th Annual IEEE Applied Power Electronics Conference and Exposition . pp. 2741-2746, APEC 2023, Orlando, 19/03/2023 . https://doi.org/10.1109/APEC43580.2023.10131150
Publication Year :
2023

Abstract

A simultaneous change of voltage magnitude and grid impedance may occur during grid faults. To reproduce such impedance variation by converter-based grid emulators, the virtual impedance (VI) control and the virtual admittance (VA) control are two typical approaches. Their dynamics when used with the L-filtered grid emulator are evaluated in this paper. Two major issues, i.e., the inaccuracy of emulated low-frequency (< 50Hz) impedance by the VI control, and the adverse interactions between VA control and its inner current control. Simulation and experimental results of an L-filtered voltage source inverter confirm the correctness of analysis.

Subjects

Subjects :
Transient impedance
virtual admittance
low-voltage ride-through
virtual impedance

Details

Language :
English
Database :
OpenAIRE
Journal :
Li, Z, Zhao, F, Chen, X, Munk-Nielsen, S & Wang, X 2023, Issues of Impedance Emulation of Converter-Based Grid Emulator for LVRT Test . in 2023 IEEE Applied Power Electronics Conference and Exposition (APEC) . pp. 2741-2746, APEC 2023, Orlando, 19/03/2023 . https://doi.org/10.1109/APEC43580.2023.10131150, Li, Z, Zhao, F, Chen, X, Munk-Nielsen, S & Wang, X 2023, Issues of Impedance Emulation of Converter-Based Grid Emulator for LVRT Test . in APEC 2023-38th Annual IEEE Applied Power Electronics Conference and Exposition . pp. 2741-2746, APEC 2023, Orlando, 19/03/2023 . https://doi.org/10.1109/APEC43580.2023.10131150
Accession number :
edsair.doi.dedup.....488c6b267ba9071f1ef3681a71a6d9c0

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