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Correlation of Field Emission and Surface Microstructure of Vertically Aligned Carbon Nanotubes
- Source :
- Microscopy and Microanalysis. 10:396-397
- Publication Year :
- 2004
- Publisher :
- Oxford University Press (OUP), 2004.
-
Abstract
- Two kinds of distinctive field emission behaviors were observed on vertically aligned multiwall carbon nanotube ~CNT! films grown by hot filament dc-plasma enhanced chemical vapor deposition. Some samples have stable emission current for more than 60 h ~type I!, while others degrade substantially in the first 16 h ~type II!. During the field emission measurement, a brief exposure to air led an abrupt decrease of emission current of all samples. But subsequent reevacuation made type I samples recover the emission current fully, whereas type II samples were damaged permanently reflecting on the irrecoverable emission current. Microstructure studies by transmission electron microscope clearly showed that the stable emission is due to a surface passivation of CNTs by a thin layer of amorphous carbon that prevents CNTs from reacting with ambient gases, e.g., oxygen, during air exposure. © 2004 American Institute of Physics. @DOI: 10.1063/1.1642272#
- Subjects :
- Materials science
Physics and Astronomy (miscellaneous)
Passivation
Analytical chemistry
Nanotechnology
Carbon nanotube
Chemical vapor deposition
Microstructure
law.invention
Field electron emission
Carbon film
Amorphous carbon
Transmission electron microscopy
law
Carbon nanotube supported catalyst
Current (fluid)
Composite material
Instrumentation
Subjects
Details
- ISSN :
- 14358115 and 14319276
- Volume :
- 10
- Database :
- OpenAIRE
- Journal :
- Microscopy and Microanalysis
- Accession number :
- edsair.doi.dedup.....4859265c4116681ca74b3821ceb84ba2
- Full Text :
- https://doi.org/10.1017/s1431927604885908