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Measurement of ligand coverage on cadmium selenide nanocrystals and its influence on dielectric dependent photoluminescence intermittency

Authors :
Guillermo Lucena Alcalde
Aidan A. E. Fisher
Mark A. Osborne
Iain J. Day
Source :
Communications Chemistry, Vol 2, Iss 1, Pp 1-9 (2019)
Publication Year :
2019
Publisher :
Springer Science and Business Media LLC, 2019.

Abstract

Photoluminescent quantum dots are used in a range of applications that exploit the unique size tuneable emission, light harvesting and quantum efficient properties of these semiconductor nanocrystals. However, optical instabilities such as photoluminescence intermittency, the stochastic switching between bright, emitting states and dark states, can hinder quantum dot performance. Correlations between this blinking of emission and the dielectric properties of the nanoenvironment between the quantum dot interface and host medium, suggest surface ligands play a role in modulating on-off switching rates. Here we elucidate the nature of the cadmium selenide nanocrystal surface, by combining magic angle spinning NMR and x-ray photoelectron spectroscopy to determine ligand surface densities, with molecular dynamics simulation to assess net ligand filling at the nanocrystal interface. Results support a high ligand coverage and are consistent with photoluminescence intermittency measurements that indicate a dominant contribution from surface ligand to the dielectric properties of the local quantum dot environment. Photoluminescent quantum dots are an important technology but can exhibit undesirable intermittent quenching of the photoluminescence. Here, a combination of NMR techniques with XPS and simulations are used to describe the surface coverage of ligands on CdSe nanoparticles and to relate the blinking dynamics to the local dielectric environment.

Details

ISSN :
23993669
Volume :
2
Database :
OpenAIRE
Journal :
Communications Chemistry
Accession number :
edsair.doi.dedup.....47b484c52e60d8259fd2f55d076f3ae8
Full Text :
https://doi.org/10.1038/s42004-019-0164-x