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Integrated Silicon Nitride Horizontal Long Period Grating for Refractometric Gas Sensing applications

Authors :
Clement Deleau
Olivier D. Bernal
Han Cheng Seat
Frederic Surre
Helene Tap
Equipe Capteurs optiques et systèmes intégrés intelligents (LAAS-OASIS)
Laboratoire d'analyse et d'architecture des systèmes (LAAS)
Université Toulouse Capitole (UT Capitole)
Université de Toulouse (UT)-Université de Toulouse (UT)-Institut National des Sciences Appliquées - Toulouse (INSA Toulouse)
Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut National des Sciences Appliquées (INSA)-Université Toulouse - Jean Jaurès (UT2J)
Université de Toulouse (UT)-Université Toulouse III - Paul Sabatier (UT3)
Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP)
Université de Toulouse (UT)-Université Toulouse Capitole (UT Capitole)
Université de Toulouse (UT)
Institut National Polytechnique (Toulouse) (Toulouse INP)
James Watt School of Engineering [Univ Glasgow]
University of Glasgow
Source :
I2MTC, 2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), 2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), May 2020, Dubrovnik, Croatia. pp.1-6, ⟨10.1109/I2MTC43012.2020.9129170⟩
Publication Year :
2020
Publisher :
IEEE, 2020.

Abstract

International audience; We designed an integrated long period grating based on the horizontal periodic tapering of a silicon nitride channel waveguide. The structure is studied for gas sensing applications, using Styrene AcryloNitrile as sensitive layer. Simulation results from the proposed architecture show a high sensitivity beyond 1700 nm/RIU using a wavelength interrogation method centered at 1550 nm for a 20pm large and 300pm long structure.

Details

Database :
OpenAIRE
Journal :
2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
Accession number :
edsair.doi.dedup.....4719186c35f14dffe460e9ebaa4892f8
Full Text :
https://doi.org/10.1109/i2mtc43012.2020.9129170